Pankratov EL. On Analytical Approach to Prognosis of Manufacturing of Voltage Divider Biasing Common Emitter Amplifier with Account Mismatch-Induced Stress – On Increasing of Density of Elements: On Analytical Approach to Prognosis of Manufacturing of Voltage Divider Biasing Common Emitter Amplifier with Account Mismatch-Induced Stress – On Increasing of Density of Elements. ajms [Internet]. 2019 Jul. 10 [cited 2024 Nov. 23];3(1). Available from: https://ajms.in/index.php/ajms/article/view/193